Detection of Wire Lift-Off in Si-IGBTs and SiC-MOSFETs Using Machine Learning on Switching Waveforms
Power cycling degradation in power modules is one of the most common failure modes in power electronic systems. This study presents a method to detect wire lift-off using machine learning analysis of switching waveforms of gate voltage and emitter/source current in Si-IGBT and SiC-MOSFET powe...
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| Autors principals: | , , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
IEEE
2026-01-01
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| Col·lecció: | IEEE Open Journal of Power Electronics |
| Matèries: | |
| Accés en línia: | https://ieeexplore.ieee.org/document/11414118/ |
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