Detection of Wire Lift-Off in Si-IGBTs and SiC-MOSFETs Using Machine Learning on Switching Waveforms

Power cycling degradation in power modules is one of the most common failure modes in power electronic systems. This study presents a method to detect wire lift-off using machine learning analysis of switching waveforms of gate voltage and emitter/source current in Si-IGBT and SiC-MOSFET powe...

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Bibliografiske detaljer

Principais autores:	Kazune Idei, Thatree Mamee, Hauke Lutzen, Nando Kaminski, Katsuhiro Hata, Makoto Takamiya, Shin-ichi Nishizawa, Wataru Saito
Format:	Artigo
Sprog:	Inglês
Udgivet:	IEEE 2026-01-01
Serier:	IEEE Open Journal of Power Electronics
Fag:	Power semiconductor devices Si-IGBT SiC-MOSFET power cycling degradation wire lift-off switching waveform
Online adgang:	https://ieeexplore.ieee.org/document/11414118/
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