Comprehensive analysis of RF sputtered ZnS thin films towards optoelectronic applications
Abstract Zinc sulfide (ZnS), a wide band gap II-VI semiconductor, has become a promising option due to its excellent transparency, chemical stability, and environmentally friendly nature. A comprehensive study of RF sputter-deposited ZnS thin films is presented, utilizing a wide range of characteriz...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2026-06-01
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| Edice: | Discover Electronics |
| Témata: | |
| On-line přístup: | https://doi.org/10.1007/s44291-026-00239-2 |
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