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Comprehensive analysis of RF sputtered ZnS thin films towards optoelectronic applications

Abstract Zinc sulfide (ZnS), a wide band gap II-VI semiconductor, has become a promising option due to its excellent transparency, chemical stability, and environmentally friendly nature. A comprehensive study of RF sputter-deposited ZnS thin films is presented, utilizing a wide range of characteriz...

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Principais autores: Sutapa Badyakar, G. Mohan Rao, Chandasree Das
פורמט: Artigo
שפה:Inglês
יצא לאור: Springer 2026-06-01
סדרה:Discover Electronics
נושאים:
ZnS
FTIR
Hall Measurements
Substrate Bias
TEM
XPS
גישה מקוונת:https://doi.org/10.1007/s44291-026-00239-2
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