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Improved Algorithm of Dueling DQN for BSIM Parameter Extraction Task

Traditional Berkeley Short-channel IGFET Model (BSIM) parameter extraction methods are inefficient, time-consuming, and heavily dependent on the experience of specialists. To tackle these issues, this paper proposes a BSIM parameter extraction algorithm based on deep reinforcement learning, combinin...

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Principais autores: Wenjun Chen, Yali Zhang, Zikang Zeng, Silin Chen, Kangjian Di, Guohao Wang, Chia-Yen Li, Ningmu Zou
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2025-01-01
Serier:IEEE Journal of the Electron Devices Society
Fag:
BSIM
parameter extraction
dueling-DQN
deep reinforcement learning
compact model
Online adgang:https://ieeexplore.ieee.org/document/11197319/
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