P2 random walk: self-supervised anomaly detection with pixel-point random walk
Abstract In the domain of intelligent manufacturing, automatic anomaly detection plays a pivotal role and holds great significance for improving production efficiency and product quality. However, the scarcity and uncertainty of anomalous data pose significant challenges in this field. Data augmenta...
Gardado en:
| Principais autores: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Springer
2023-12-01
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| Series: | Complex & Intelligent Systems |
| Assuntos: | |
| Acceso en liña: | https://doi.org/10.1007/s40747-023-01285-z |
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