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P2 random walk: self-supervised anomaly detection with pixel-point random walk

Abstract In the domain of intelligent manufacturing, automatic anomaly detection plays a pivotal role and holds great significance for improving production efficiency and product quality. However, the scarcity and uncertainty of anomalous data pose significant challenges in this field. Data augmenta...

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Váldodahkkit: Liujie Hua, Qianqian Qi, Jun Long
Materiálatiipa: Artigo
Giella:Inglês
Almmustuhtton: Springer 2023-12-01
Ráidu:Complex & Intelligent Systems
Fáttát:
Liŋkkat:https://doi.org/10.1007/s40747-023-01285-z
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