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Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples

Abstract Industrial image anomaly detection (AD) is a critical issue that has been investigated in different research areas. Many works have attempted to detect anomalies by simulating anomalous samples. However, how to simulate abnormal samples remains a significant challenge. In this study, a meth...

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Détails bibliographiques
Auteurs principaux: Mingjing Pei, Ningzhong Liu, Bing Zhao, Han Sun
Format: Artigo
Langue:Inglês
Publié: Springer 2023-09-01
Collection:International Journal of Computational Intelligence Systems
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Accès en ligne:https://doi.org/10.1007/s44196-023-00328-0
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