A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)
The semiconductor industry plays a vital role in modern technology, with semiconductor devices embedded in almost all electronic products. As these devices become increasingly complex, ensuring quality and reliability poses significant challenges. Electrical testing on semiconductor wafers for defec...
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| Autors principals: | , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
IEEE
2025-01-01
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| Col·lecció: | IEEE Access |
| Matèries: | |
| Accés en línia: | https://ieeexplore.ieee.org/document/10855443/ |
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