A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)
The semiconductor industry plays a vital role in modern technology, with semiconductor devices embedded in almost all electronic products. As these devices become increasingly complex, ensuring quality and reliability poses significant challenges. Electrical testing on semiconductor wafers for defec...
-д хадгалсан:
| Үндсэн зохиолчид: | , , , , |
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| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
IEEE
2025-01-01
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| Цуврал: | IEEE Access |
| Нөхцлүүд: | |
| Онлайн хандалт: | https://ieeexplore.ieee.org/document/10855443/ |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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