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Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic...

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Auteurs principaux: Lu Fu, Zhaowen Yan, Changshun Fu, Donglin Su
Format: Artigo
Langue:Inglês
Publié: IEEE 2021-01-01
Collection:IEEE Access
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Accès en ligne:https://ieeexplore.ieee.org/document/9599676/
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