Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Lu Fu, Zhaowen Yan, Changshun Fu, Donglin Su
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	IEEE 2021-01-01
Schriftenreihe:	IEEE Access
Schlagworte:	Integrated circuit (IC) conducted susceptibility electromagnetic compatibility (EMC) electromagnetic immunity conducted susceptibility phenomena
Online-Zugang:	https://ieeexplore.ieee.org/document/9599676/
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