Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs
Abstract This paper systematically investigates the thermal failure mechanisms of 14 nm Ferro-FinFETs using the TCAD tools, incorporating both Preisach and thermodynamic models. A comparative analysis under programming (+ 4 V, 100 ns) and erasing (− 4 V, 100 ns) conditions reveals distinct ferroelec...
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| Hauptverfasser: | , , , , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Springer
2026-05-01
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| Schriftenreihe: | Discover Nano |
| Schlagworte: | |
| Online-Zugang: | https://doi.org/10.1186/s11671-026-04582-x |
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