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Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters

Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices, and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in overlay print...

Ausführliche Beschreibung

Gespeichert in:
Bibliografische Detailangaben
Hauptverfasser: Anood Shakeel, Bijendra Bishow Maskey, Sagar Shrestha, Sajjan Parajuli, Younsu Jung, Gyoujin Cho
Format: Artigo
Sprache:Inglês
Veröffentlicht: MDPI AG 2023-03-01
Schriftenreihe:Nanomaterials
Schlagworte:
Online-Zugang:https://www.mdpi.com/2079-4991/13/6/1008
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