Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters
Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices, and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in overlay print...
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| Format: | Artigo |
| Sprache: | Inglês |
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MDPI AG
2023-03-01
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| Schriftenreihe: | Nanomaterials |
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| Online-Zugang: | https://www.mdpi.com/2079-4991/13/6/1008 |
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