Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters

Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices, and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in overlay print...

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Xehetasun bibliografikoak
Egile Nagusiak:	Anood Shakeel, Bijendra Bishow Maskey, Sagar Shrestha, Sajjan Parajuli, Younsu Jung, Gyoujin Cho
Formatua:	Artigo
Hizkuntza:	Inglês
Argitaratua:	MDPI AG 2023-03-01
Saila:	Nanomaterials
Gaiak:	roll-to-roll gravure printing digital twins thin film transistors overlay printing registration accuracy predictive modeling
Sarrera elektronikoa:	https://www.mdpi.com/2079-4991/13/6/1008
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters

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