QR code

The Relationship between Electron Transport and Microstructure in Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> Alloy

Phase-change random-access memory (PCRAM) holds great promise for next-generation information storage applications. As a mature phase change material, Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> alloy (GST) relies on the distinct electrical properties of different states to achieve information storag...

Volledige beschrijving

Bewaard in:
Bibliografische gegevens
Hoofdauteurs: Cheng Liu, Yonghui Zheng, Tianjiao Xin, Yunzhe Zheng, Rui Wang, Yan Cheng
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MDPI AG 2023-01-01
Reeks:Nanomaterials
Onderwerpen:
Online toegang:https://www.mdpi.com/2079-4991/13/3/582
Tags: Voeg label toe
Geen labels, Wees de eerste die dit record labelt!