Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energ...

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Autors principals:	Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li
Format:	Artigo
Idioma:	Inglês
Publicat:	Beilstein-Institut 2022-07-01
Col·lecció:	Beilstein Journal of Nanotechnology
Matèries:	atomic force microscopy kelvin probe force microscopy photocatalyst surface photovoltage titanium dioxide
Accés en línia:	https://doi.org/10.3762/bjnano.13.63
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