Artifacts in time-resolved Kelvin probe force microscopy
Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest. Recently, several techniques for time-resolved measurements with time resolu...
Αποθηκεύτηκε σε:
| Κύριοι συγγραφείς: | , , |
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| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Beilstein-Institut
2018-04-01
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| Σειρά: | Beilstein Journal of Nanotechnology |
| Θέματα: | |
| Διαθέσιμο Online: | https://doi.org/10.3762/bjnano.9.119 |
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