Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy
A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bilayer graphene as a test structure and obtaining KP...
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| Autores principales: | , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2023-06-01
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| Colección: | C |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/2311-5629/9/3/62 |
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