Interface-driven anomalies in irradiation damage: Multiscale simulation of asymmetric diffusion and mechanical degradation in SnPb solder joints under electron irradiation
Understanding the interfacial atomic mechanisms and degradation pathways in solder joints under irradiation is critical for the long-term reliability of electronic packaging in harsh environments. This study elucidates the atomic-scale mechanisms governing microstructural evolution and mechanical pr...
Wedi'i Gadw mewn:
| Prif Awduron: | , , , , , , , , |
|---|---|
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
Elsevier
2025-09-01
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| Cyfres: | Materials & Design |
| Pynciau: | |
| Mynediad Ar-lein: | http://www.sciencedirect.com/science/article/pii/S0264127525008755 |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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