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Switchable‐Memory Operation of Silicon Nanowire Transistor

Abstract The switchable‐memory operation of a feedback silicon nanowire transistor with a dual‐gate structure is demonstrated. The single transistor exhibits volatile memory characteristics with a retention time longer than 3600 s, as well as a switching capability with a subthreshold swing lower th...

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Bibliografiset tiedot
Päätekijät: Yoonjoong Kim, Jinsun Cho, Doohyeok Lim, Sola Woo, Kyoungah Cho, Sangsig Kim
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Wiley-VCH 2018-12-01
Sarja:Advanced Electronic Materials
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Linkit:https://doi.org/10.1002/aelm.201800429
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