Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient (dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions can be performed in the intermittent contact regime in different environments. Such combination provides sensitive detect...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Sergei Magonov, John Alexander
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	Beilstein-Institut 2011-01-01
Schriftenreihe:	Beilstein Journal of Nanotechnology
Schlagworte:	atomic force microscopy fluoroalkanes Kelvin force microscopy surface potential
Online-Zugang:	https://doi.org/10.3762/bjnano.2.2
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