An Investigation of Reliability and Life Time Prediction for Power MOSFET Using Electronically and Statistical Technique
This work is aimed to estimate the life time of the MOSFET power transistor through an empirical implementation work merged with statistical applications. In the empirical part the MOSFET power transistors are subjected to high frequency(50kHz) via an electronically controlled model using advanced d...
-д хадгалсан:
| Үндсэн зохиолчид: | , , |
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| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
Unviversity of Technology- Iraq
2013-04-01
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| Цуврал: | Engineering and Technology Journal |
| Нөхцлүүд: | |
| Онлайн хандалт: | https://etj.uotechnology.edu.iq/article_84170_3e35b4b98cb472a0c12624f08363665c.pdf |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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