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Improved Endurance of Ferroelectric Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Using Laminated-Structure Interlayer

In this article, the endurance characteristic of the TiN/HZO/TiN capacitor was improved by the laminated structure of a ferroelectric Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> thin film. Altering the HZO deposition ratio, the laminated-structure interlayer was formed in the middle of the HZO fil...

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Principais autores: Meiwen Chen, Shuxian Lv, Boping Wang, Pengfei Jiang, Yuanxiang Chen, Yaxin Ding, Yuan Wang, Yuting Chen, Yan Wang
格式: Artigo
语言:Inglês
出版: MDPI AG 2023-05-01
丛编:Nanomaterials
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在线阅读:https://www.mdpi.com/2079-4991/13/10/1608
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