EXtra-Xwiz: A Tool to Streamline Serial Femtosecond Crystallography Workflows at European XFEL

X-ray free electron lasers deliver photon pulses that are bright enough to observe diffraction from extremely small crystals at a time scale that outruns their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high pulse...

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Autores principales:	Oleksii Turkot, Fabio Dall’Antonia, Richard J. Bean, Juncheng E, Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry J. Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo V. M. Melo, Adam Round, Michael Schuh, Egor Sobolev, Raphaël de Wijn, James J. Wrigley, Luca Gelisio
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	MDPI AG 2023-10-01
Colección:	Crystals
Materias:	serial femtosecond crystallography SFX <i>EXtra-Xwiz</i> pipeline <i>CrystFEL</i>
Acceso en línea:	https://www.mdpi.com/2073-4352/13/11/1533
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