EXtra-Xwiz: A Tool to Streamline Serial Femtosecond Crystallography Workflows at European XFEL

X-ray free electron lasers deliver photon pulses that are bright enough to observe diffraction from extremely small crystals at a time scale that outruns their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high pulse...

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Principais autores:	Oleksii Turkot, Fabio Dall’Antonia, Richard J. Bean, Juncheng E, Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry J. Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo V. M. Melo, Adam Round, Michael Schuh, Egor Sobolev, Raphaël de Wijn, James J. Wrigley, Luca Gelisio
格式:	Artigo
語言:	Inglês
出版:	MDPI AG 2023-10-01
叢編:	Crystals
主題:	serial femtosecond crystallography SFX <i>EXtra-Xwiz</i> pipeline <i>CrystFEL</i>
在線閱讀:	https://www.mdpi.com/2073-4352/13/11/1533
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