EXtra-Xwiz: A Tool to Streamline Serial Femtosecond Crystallography Workflows at European XFEL

X-ray free electron lasers deliver photon pulses that are bright enough to observe diffraction from extremely small crystals at a time scale that outruns their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high pulse...

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Detalhes bibliográficos

Principais autores:	Oleksii Turkot, Fabio Dall’Antonia, Richard J. Bean, Juncheng E, Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry J. Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo V. M. Melo, Adam Round, Michael Schuh, Egor Sobolev, Raphaël de Wijn, James J. Wrigley, Luca Gelisio
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2023-10-01
coleção:	Crystals
Assuntos:	serial femtosecond crystallography SFX <i>EXtra-Xwiz</i> pipeline <i>CrystFEL</i>
Acesso em linha:	https://www.mdpi.com/2073-4352/13/11/1533
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