Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling

In order to understand the fracture resistance of nanocrystalline thin films, it is necessary to assess nanoscopic multiaxial stress fields accompanying crack growth during irreversible deformation. Here, a clamped cantilever with dimensions of 200 × 23.7 × 40 μm3 was machined by focused ion beam mi...

Cijeli opis

Bibliografski detalji

Glavni autori:	M. Meindlhumer, L.R. Brandt, J. Zalesak, M. Rosenthal, H. Hruby, J. Kopecek, E. Salvati, C. Mitterer, R. Daniel, J. Todt, J. Keckes, A.M. Korsunsky
Format:	Artigo
Jezik:	Inglês
Izdano:	Elsevier 2021-01-01
Serija:	Materials & Design
Teme:	Cross-sectional X-ray nanodiffraction Micromechanics CrN Cr Multi-layer Eigenstrain modelling
Online pristup:	http://www.sciencedirect.com/science/article/pii/S0264127520309011
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!