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Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling

In order to understand the fracture resistance of nanocrystalline thin films, it is necessary to assess nanoscopic multiaxial stress fields accompanying crack growth during irreversible deformation. Here, a clamped cantilever with dimensions of 200 × 23.7 × 40 μm3 was machined by focused ion beam mi...

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Principais autores: M. Meindlhumer, L.R. Brandt, J. Zalesak, M. Rosenthal, H. Hruby, J. Kopecek, E. Salvati, C. Mitterer, R. Daniel, J. Todt, J. Keckes, A.M. Korsunsky
Format: Artigo
Sprog:Inglês
Udgivet: Elsevier 2021-01-01
Serier:Materials & Design
Fag:
Cross-sectional X-ray nanodiffraction
Micromechanics
CrN
Cr
Multi-layer
Eigenstrain modelling
Online adgang:http://www.sciencedirect.com/science/article/pii/S0264127520309011
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