Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling

In order to understand the fracture resistance of nanocrystalline thin films, it is necessary to assess nanoscopic multiaxial stress fields accompanying crack growth during irreversible deformation. Here, a clamped cantilever with dimensions of 200 × 23.7 × 40 μm3 was machined by focused ion beam mi...

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Bibliografische Detailangaben

Hauptverfasser:	M. Meindlhumer, L.R. Brandt, J. Zalesak, M. Rosenthal, H. Hruby, J. Kopecek, E. Salvati, C. Mitterer, R. Daniel, J. Todt, J. Keckes, A.M. Korsunsky
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	Elsevier 2021-01-01
Schriftenreihe:	Materials & Design
Schlagworte:	Cross-sectional X-ray nanodiffraction Micromechanics CrN Cr Multi-layer Eigenstrain modelling
Online-Zugang:	http://www.sciencedirect.com/science/article/pii/S0264127520309011
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