Cathodoluminescence and Cross-sectional Transmission Electron Microscopy Studies for Deformation Behaviors of GaN Thin Films Under Berkovich Nanoindentation
<p>Abstract</p><p>In this study, details of Berkovich nanoindentation-induced mechanical deformation mechanisms of metal-organic chemical-vapor deposition-derived GaN thin films have been systematic investigated with the aid of the cathodoluminescence (CL) and the cross-sectional transmission electr...
Sábháilte in:
| Príomhchruthaitheoirí: | , , |
|---|---|
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe / Cruthaithe: |
SpringerOpen
2008-01-01
|
| Sraith: | Nanoscale Research Letters |
| Ábhair: | |
| Rochtain ar líne: | http://dx.doi.org/10.1007/s11671-008-9130-8 |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
