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Cathodoluminescence and Cross-sectional Transmission Electron Microscopy Studies for Deformation Behaviors of GaN Thin Films Under Berkovich Nanoindentation

<p>Abstract</p><p>In this study, details of Berkovich nanoindentation-induced mechanical deformation mechanisms of metal-organic chemical-vapor deposition-derived GaN thin films have been systematic investigated with the aid of the cathodoluminescence (CL) and the cross-sectional transmission electr...

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Sábháilte in:
Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Teng I-Ju, Lu Jian-Ming, Jian Sheng-Rui
Formáid: Artigo
Teanga:Inglês
Foilsithe / Cruthaithe: SpringerOpen 2008-01-01
Sraith:Nanoscale Research Letters
Ábhair:
Rochtain ar líne:http://dx.doi.org/10.1007/s11671-008-9130-8
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