Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest compone...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI AG
2021-01-01
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| Edice: | Sensors |
| Témata: | |
| On-line přístup: | https://www.mdpi.com/1424-8220/21/2/362 |
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