Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest compone...

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Bibliografski detalji

Glavni autori:	Luke Oduor Otieno, Bernard Ouma Alunda, Jaehyun Kim, Yong Joong Lee
Format:	Artigo
Jezik:	Inglês
Izdano:	MDPI AG 2021-01-01
Serija:	Sensors
Teme:	atomic force microscopy high-speed atomic force microscope high-speed atomic force microscope scan-head
Online pristup:	https://www.mdpi.com/1424-8220/21/2/362
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