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Defective Structure of Silicon Doped with Dysprosium

In this work, the structural and optical characteristics of silicon (n-Si) samples and its compositions with dysprosium (n-Si-Dy) were analyzed using Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy methods. Characteristic peaks in the FTIR spectra such as 640 cm-1 (Si-H mode) a...

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Autors principals: Khodjakbar S. Daliev, Sharifa B. Utamuradova, Alisher Khaitbaev, Jonibek J. Khamdamov, Shahriyor B. Norkulov, Mansur B. Bekmuratov
Format: Artigo
Idioma:Inglês
Publicat: V.N. Karazin Kharkiv National University Publishing 2024-06-01
Col·lecció:East European Journal of Physics
Matèries:
silicon
dysprosium
rare earth elements
raman scattering
diffusion
heat treatment
temperature
Accés en línia:https://periodicals.karazin.ua/eejp/article/view/23346
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