Defective Structure of Silicon Doped with Dysprosium
In this work, the structural and optical characteristics of silicon (n-Si) samples and its compositions with dysprosium (n-Si-Dy) were analyzed using Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy methods. Characteristic peaks in the FTIR spectra such as 640 cm-1 (Si-H mode) a...
Na minha lista:
| Principais autores: | , , , , , |
|---|---|
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
V.N. Karazin Kharkiv National University Publishing
2024-06-01
|
| Serier: | East European Journal of Physics |
| Fag: | |
| Online adgang: | https://periodicals.karazin.ua/eejp/article/view/23346 |
| Tags: |
Ingen Tags, Vær først til at tagge denne postø!
|