Structural Properties of Silicon Doped Rare Earth Elements Ytterbium
This paper presents the results of a study of the state of ytterbium atoms in silicon, carried out using the methods of Fourier transform infrared spectroscopy (IR) and Raman spectroscopy (RS). Silicon samples doped with ytterbium impurities were analyzed using FSM-2201 and SENTERRA II Bruker spectr...
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| Главные авторы: | , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
V.N. Karazin Kharkiv National University Publishing
2024-03-01
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| Серии: | East European Journal of Physics |
| Предметы: | |
| Online-ссылка: | https://periodicals.karazin.ua/eejp/article/view/23055 |
| Метки: |
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