SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features and Dual Loss Functions
The detection of surface defects on printed circuit board (PCB) plays a vital role. However, current defect detection methods face significant challenges, such as frequently misidentifying non-defective areas as defects, low defect recognition capability, and diminished accuracy in identifying minor...
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| Автори: | , , , , , |
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| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
IEEE
2024-01-01
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| Серія: | IEEE Access |
| Предмети: | |
| Онлайн доступ: | https://ieeexplore.ieee.org/document/10613407/ |
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