SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features and Dual Loss Functions
The detection of surface defects on printed circuit board (PCB) plays a vital role. However, current defect detection methods face significant challenges, such as frequently misidentifying non-defective areas as defects, low defect recognition capability, and diminished accuracy in identifying minor...
Gardado en:
| Principais autores: | , , , , , |
|---|---|
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
IEEE
2024-01-01
|
| Series: | IEEE Access |
| Assuntos: | |
| Acceso en liña: | https://ieeexplore.ieee.org/document/10613407/ |
| Tags: |
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|