YOLO-PDS: An Improved YOLO11 Algorithm for PCB Surface Defect Detection

Aiming at the challenges of tiny size and subtle features in PCB surface defects, as well as the insufficient accuracy and high miss rate of small-target detection in standard YOLO11, this paper proposes an improved YOLO11 defect detection algorithm. This paper redesigns the Neck structure by introd...

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Hlavní autoři:	Zheming Wang, Xinguang Zhang, Yewei Shen
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2026-01-01
Edice:	IEEE Access
Témata:	PCB surface defects YOLO11 P2 feature layer MSFE-DFF module Shape-IoU loss multi-scale feature fusion
On-line přístup:	https://ieeexplore.ieee.org/document/11594847/
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