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Radiation Tolerant Electronics, Volume II

Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation har...

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Podrobná bibliografie
Korporativní autor:	Leroux, Paul
Médium:	Livro
Jazyk:	Inglês
Vydáno:	MDPI - Multidisciplinary Digital Publishing Institute 2023
Témata:	thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities triple modular redundancy 65 nm CMOS technology single event effects radiation hardening by design digital integrated circuits fault injection simulation VHDL open source tools triple modular redundancy TMR time redundancy (TR) TMR/Simplex reliability improvement factor (RIF) half-duty limited DC-DC converter total ionizing dose system-level testing point-of-load converter radiation hardness assurance system qualification All-Digital PLL CDR Single-Event Effects radiation hardening system-level tests D Flip-Flop heavy ion radiation hardened Single Event Upset D-type flip-flop single event transient single event upset quadrature super-harmonic LC-tank Q-phase VCO QVCO radiation TID SEE X-ray high energy physics radiation hardened by design 22-nm FD SOI 28-nm FD SOI Co-60 flip-flop (FF) radiation effects ring oscillator (RO) static random-access memory (SRAM) total ionizing dose (TID) radiation effect radiation test method sensitive area parasitic bipolar amplification processor laser test generalized linear model ensemble method confidence interval double-node upset (DNU) radiation-hardened latch radiation hardening by design (RHBD) single event upset polarity single-node upset (SNU) soft error n/a
On-line přístup:	https://directory.doabooks.org/handle/20.500.12854/96685
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Radiation Tolerant Electronics, Volume II

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