Radiation Tolerant Electronics, Volume II

Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation har...

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Detaylı Bibliyografya
Müşterek Yazar: Leroux, Paul
Materyal Türü: Livro
Dil:Inglês
Baskı/Yayın Bilgisi: MDPI - Multidisciplinary Digital Publishing Institute 2023
Konular:
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities
triple modular redundancy
65 nm CMOS technology
single event effects
radiation hardening by design
digital integrated circuits
fault injection
simulation
VHDL
open source tools
triple modular redundancy TMR
time redundancy (TR)
TMR/Simplex
reliability improvement factor (RIF)
half-duty limited DC-DC converter
total ionizing dose
system-level testing
point-of-load converter
radiation hardness assurance
system qualification
All-Digital
PLL
CDR
Single-Event Effects
radiation hardening
system-level tests
D Flip-Flop
heavy ion
radiation hardened
Single Event Upset
D-type flip-flop
single event transient
single event upset
quadrature
super-harmonic
LC-tank
Q-phase
VCO
QVCO
radiation
TID
SEE
X-ray
high energy physics
radiation hardened by design
22-nm FD SOI
28-nm FD SOI
Co-60
flip-flop (FF)
radiation effects
ring oscillator (RO)
static random-access memory (SRAM)
total ionizing dose (TID)
radiation effect
radiation test method
sensitive area
parasitic bipolar amplification
processor
laser test
generalized linear model
ensemble method
confidence interval
double-node upset (DNU)
radiation-hardened latch
radiation hardening by design (RHBD)
single event upset polarity
single-node upset (SNU)
soft error
n/a
Online Erişim:https://directory.doabooks.org/handle/20.500.12854/96685
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