Absolute position total internal reflection microscopy with an optical tweezer

Por Liu, Lulu, Woolf, Alexander, Rodriguez, Alejandro W., Capasso, Federico
Publicado no Proc Natl Acad Sci U S A (2014)

Effect of Threading Dislocations on the Quality Factor of InGaN/GaN Microdisk Cavities

Por Puchtler, Tim J., Woolf, Alexander, Zhu, Tongtong, Gachet, David, Hu, Evelyn L., Oliver, Rachel A.
Publicado no ACS Photonics (2014)

Distinctive signature of indium gallium nitride quantum dot lasing in microdisk cavities

Por Woolf, Alexander, Puchtler, Tim, Aharonovich, Igor, Zhu, Tongtong, Niu, Nan, Wang, Danqing, Oliver, Rachel, Hu, Evelyn L.
Publicado em 2014