1
di Mulrow, C D, Chiquette, E, Ferrer, R L, Sibai, B M, Stevens, K R, Harris, M, Montgomery, K A, Stamm, K
Pubblicato in Evid Rep Technol Assess (Summ) (2000)
TestoPubblicato in Evid Rep Technol Assess (Summ) (2000)
Testo
Artigo
2
di Mulrow, C D, Williams, J W, Trivedi, M, Chiquette, E, Aguilar, C, Cornell, J E, Badgett, R, Noel, P H, Lawrence, V, Lee, S, Luther, M, Ramirez, G, Richardson, W S, Stamm, K
Pubblicato in Evid Rep Technol Assess (Summ) (1999)
TestoPubblicato in Evid Rep Technol Assess (Summ) (1999)
Testo
Artigo
3
di Mulrow, C, Lawrence, V, Jacobs, B, Dennehy, C, Sapp, J, Ramirez, G, Aguilar, C, Montgomery, K, Morbidoni, L, Arterburn, J M, Chiquette, E, Harris, M, Mullins, D, Vickers, A, Flora, K
Pubblicato in Evid Rep Technol Assess (Summ) (2000)
TestoPubblicato in Evid Rep Technol Assess (Summ) (2000)
Testo
Artigo
4
di Mulrow, C, Lawrence, V, Ackermann, R, Gilbert Ramirez, G, Morbidoni, L, Aguilar, C, Arterburn, J, Block, E, Chiquette, E, Gardener, C, Harris, M, Heidenreich, P, Mullins, D, Richardson, M, Russell, N, Vickers, A, Young, V
Pubblicato in Evid Rep Technol Assess (Summ) (2000)
TestoPubblicato in Evid Rep Technol Assess (Summ) (2000)
Testo
Artigo