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Por Mulrow, C D, Williams, J W, Trivedi, M, Chiquette, E, Aguilar, C, Cornell, J E, Badgett, R, Noel, P H, Lawrence, V, Lee, S, Luther, M, Ramirez, G, Richardson, W S, Stamm, K
Publicado no Evid Rep Technol Assess (Summ) (1999)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (1999)
Obter o texto integral
Artigo