Effect of Annealing Process on the Properties of Ni(55%)Cr(40%)Si(5%) Thin-Film Resistors

Por Cheng, Huan-Yi, Chen, Ying-Chung, Li, Pei-Jou, Yang, Cheng-Fu, Huang, Hong-Hsin
Publicado no Materials (Basel) (2015)

Biosensor for human IgE detection using shear-mode FBAR devices

Por Chen, Ying-Chung, Shih, Wei-Che, Chang, Wei-Tsai, Yang, Chun-Hung, Kao, Kuo-Sheng, Cheng, Chien-Chuan
Publicado no Nanoscale Res Lett (2015)

Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors

Por Cheng, Huan-Yi, Chen, Ying-Chung, Li, Chi-Lun, Li, Pei-Jou, Houng, Mau-Phon, Yang, Cheng-Fu
Publicado no Nanomaterials (Basel) (2016)

Surface scattering mechanisms of tantalum nitride thin film resistor

Por Chen, Huey-Ru, Chen, Ying-Chung, Chang, Ting-Chang, Chang, Kuan-Chang, Tsai, Tsung-Ming, Chu, Tian-Jian, Shih, Chih-Cheng, Chuang, Nai-Chuan, Wang, Kao-Yuan
Publicado em 2014

Mechanisms of Low-Temperature Nitridation Technology on a TaN Thin Film Resistor for Temperature Sensor Applications

Por Chen, Huey-Ru, Chen, Ying-Chung, Chang, Ting-Chang, Chang, Kuan-Chang, Tsai, Tsung-Ming, Chu, Tian-Jian, Shih, Chih-Cheng, Chuang, Nai-Chuan, Wang, Kao-Yuan
Publicado no Nanoscale Res Lett (2016)