Photoreflectance study of the GaAs buffer layer in InAs/GaAs quantum dots
GaAs buffer layer in InAs /GaAs quantum dots (QDs) was investigated by Photoreflectance (PR) technique at 300 K. PR spectra obtained were compared with commercial GaAs sample PR spectra, and they were analyzed by using the derivative Lorentzian functions as propose...
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| Опубликовано в:: | Superficies y vacío |
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| Главные авторы: | , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2017
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| Предметы: | |
| Online-ссылка: | https://www.redalyc.org/articulo.oa?id=94254621002 |
| Метки: |
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