Technological aspects of growth and optical properties of thin CIGS films

The paper discusses the results of structural and optical investigations of CuInxGa1-xSe2 (CIGS) semiconductor films with molar composition 0≤x≤1 obtained by thermal evaporation in vacuum. Experimental methods used to characterize the materials included ellipsometry measurements...

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Bibliografske podrobnosti
izdano v:Superficies y vacío
Main Authors: V. V. Gorley, P. P. Horley, Y. V. Vorobiev, V. V. Khomyak, S. V. Bilichuk, J. González Hernández
Format: Artigo
Jezik:Inglês
Izdano: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 2004
Teme:
Física, Astronomía y Matemáticas
CIGS
Kramers
Sputtering
Thin films
Ellipsometry
Online dostop:https://www.redalyc.org/articulo.oa?id=94217303
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