Compositional mixture in R.F. sputtered CdTe oxide films. Raman spectroscopy results
In this work, radiofrequency sputtered CdTe oxide (CdTeO) films with different oxygen contents werestudied by Raman spectroscopy. In films with oxygen contents minor than 0.37 at., we observed bandsassociated with the LO and 2LO modes of CdTe. As oxygen content increases up to 0.60 at., they appearb...
שמור ב:
| הוצא לאור ב: | Superficies y vacío |
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| Principais autores: | , , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
2003
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| נושאים: | |
| גישה מקוונת: | https://www.redalyc.org/articulo.oa?id=94216308 |
| תגים: |
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