Cargando...
Interferometric thickness determination of thin metallic films
The deposition of thin metallic films on substrates is a common procedure, with a great number of different techniques, for a variety of practical and scientific applications. One of the most important properties to adjust is the thickness of the film. In special applications like MBE, this is made...
Gardado en:
| Publicado en: | Superficies y vacío |
|---|---|
| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
|
| Assuntos: | |
| Acceso en liña: | https://www.redalyc.org/articulo.oa?id=94200974 |
| Tags: |
Engadir etiqueta
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|