Interferometric thickness determination of thin metallic films
The deposition of thin metallic films on substrates is a common procedure, with a great number of different techniques, for a variety of practical and scientific applications. One of the most important properties to adjust is the thickness of the film. In special applications like MBE, this is made...
Wedi'i Gadw mewn:
| Cyhoeddwyd yn: | Superficies y vacío |
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| Prif Awduron: | , , |
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| Pynciau: | |
| Mynediad Ar-lein: | https://www.redalyc.org/articulo.oa?id=94200974 |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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