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Structure of Si nano-clusters in ZnO matrix
The composite films of Si/ZnO were grown on cuartz substrates by co sputtering of Si and ZnO targets. Transmission electron microscope (TEM) images demonstrated a homogeneous distribution of clusters in the matrix with average size varied from 3.7 nm to 34 nm depending on the temperature of annealin...
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| Gepubliceerd in: | Superficies y vacío |
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| Hoofdauteurs: | , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| Onderwerpen: | |
| Online toegang: | https://www.redalyc.org/articulo.oa?id=94200949 |
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